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HDI 4W AET
Key Features:
• High Speed Measurement – Utilises the Flash™ 3rd generation measurement engine; each point is tested in an ultra short cycle, dramatically accelerating the overall test flow.
• Clamp (4–8 interchangeable claws) – Provides controllable gripping force and micron level positioning, protecting ultra thin substrates while offering the flexibility to adapt to different board sizes.
• Breakdown Detection – Independent high speed measurement channel delivers real time, predictive breakdown detect, capable of catching high voltage layer to layer shorts and micro opens.
• AOI Electrical Test Integration – Built in AOIn™ image engine provides automatic alignment and rapid calibration, cutting fixture setup time dramatically.
Typical Applications:
• Multi layer HDI boards for smartphones, tablets, wearables
• Miniature antennas, optical communication links, high frequency/high speed transmission lines
• Any high density interconnect product that requires precise four wire testing
Customer Benefits:
• Very fast test cycles; fully automated flow reduces overall test time
• Micron level positioning and stable gripping improve test reliability
• Immediate predictive alerts help catch potential failures early
• Integrated AOI electrical testing lowers labor costs and shortens fixture adjustment time