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CSP 4W AET
Key Features:
• Synchronous Measurement – Flash™ 3rd generation engine can acquire up to eight test lines simultaneously, increasing throughput.
• Breakdown Detection – Embedded voltage step and slope analysis not only detects breakdown instantly but also grades the severity of the fault.
• Real Time Pin Damage Inspection – AOIn™ vision technology identifies pin scratches or other defects during testing, reducing rework.
• AOI Electrical Test Integration – Automatic alignment and fast calibration substantially shorten fixture adjustment time.
Typical Applications:
• CSP devices for smartphones, IoT sensor modules, automotive cameras, etc.
• High speed data transfer chips that need batch testing and verification
Customer Benefits:
• Multi channel synchronous testing greatly boosts production capacity
• Accurate breakdown grading enhances yield and reliability
• Real time damage detection lowers rework expenses
• AOI electrical integration reduces fixture setup time and manual labor